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Author: wp-admin
Modern Test Method Reveals Potential Savings in Electronics Production
Smart ICT optimizes cycle times thanks to parallel test functions.
Despite this exceptional global situation, we at ProMik always strive to develop new innovations. SMART ICT is our newest testing solution for applications with no test pads or just a limited amount available. Since the first market introduction at this year’s Productronica in Munich, we have implemented SMART ICT functions within numerous production locations globally and received great feedback, we have decided to communicate it with all our customers and partners. Hence, if you want to hear more have a short read of below article to get a quick overview of SMART ICTs features and how you could benefit within your field of application.
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